Improvement of preferred orientation of NiAlÕCrMn underlayers deposited on prebaked tape substrates
نویسندگان
چکیده
It was observed that the coercivity of CoCrPt films deposited on a polyimide tape was much lower than the coercivity deposited on a rigid glass substrate under identical conditions. X-ray diffraction showed that the desirable ~112! and ~110! texture of the NiAl/CrMn underlayers on the tape substrate was severely degraded during the deposition process. This resulted in the destruction of ~10.0! growth texture of CoCrPt films and a significant reduction of magnetic coercivity. However, degassing of the tape substrate under vacuum before deposition significantly enhanced the magnetic properties. The coercivity of the film reached 170 kA/m which is near that achieved on a glass substrate. Auger analysis also revealed that oxygen was present in the NiAl/CrMn underlayers deposited without degassing the tape substrate. © 2002 American Institute of Physics. @DOI: 10.1063/1.1452285#
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